Electron microscopy - CimeX
Microscopy Center of the Ecole polytechnique.
Main technical features
- FEI Titan ETEM Cs corrected image 60-300kV (dedicated to molecular beam epitaxie (MBE) and Chemical vapor Deposition (CVD))
- FEI Titan Themis 80-300 kV (dedicated to liquid phase and cryo-microscopy)
- JEOL 2010F 200 kV
- HITACHI S4800 FESEM
- FEI Titan Themis Cs corrected probe 80-200kV (equipment shared with C2N and LPS available at 30% of the time)
- Cryo-transfer holder (Gatan et Fishone)
- Heating and electrical sample holder (Protochips Aduro)
- Sample holder for liquid and electrochemistry (Protochips Poseidon)
Sample preparation
- FEI Scios FIB dual beam (equipment shared with C2N and LPS available at 30% of the time)Ultra-cryomicrotome Leica UC7
- Eletrochemical polishing
- Mechanical polishing (Tripode)
- Plasma cleaner
- Ultrasonic cutter
- Dimple grinder
Access conditions
- Collaborations in the framework of scientific projects
- Invoicing (it will depend on the equipment that will be used and on the involvement of an engineer)
- service provision
Contacts