Scanning Electron Microscopy / X-Ray energy spectroscopy and FIB
The SEM-FIB microscopy facility at IMPMC provides Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) expertise for all researchers (from academy to industry) needing versatile, high resolution, state-of-the art electron and ion microscopies to characterize their materials at the nanoscale. Fully integrated in the Institute of Institut de Minéralogie, Physique des Matériaux et de Cosmochimie (IMPMC CNRS UMR7590) in the Jussieu campus, the platform coordinates the imaging and nano milling needs and provides expertise for research groups using a wide variety of techniques to address a range of fundamental scientific questions using different approaches.
Main technical features
List of equipment’s
2 Microscopes
- FIB Zeiss Neon40EsB+Bruker Quantax XEDS + Atlas 3D Tomography Module & mosaïc aquisition
- SEM-FEG Zeiss Ultra55 + Bruker Quantax XEDS
Sample preparation
• Ion Ar+ cryo polishing system Leica • Fine Polishing TXP Leica System • UHR C evaporating and metal sputtering coater • Critical Point Drier Leica EM CPD300
Access conditions
Access to platform equipment is open to internal staff and to external users, with priority given to PhD studients. Users get trained by Imene Esteve to become autonomous.