Synchrotron beamline SMIS
The SMIS spectromicroscopy beamline aims to deliver high brilliance infrared radiation in the 2.5-100 microns spectral range. The synchrotron beam is split to operate two systems working in parallel. The beamline is dedicated to microscopic analysis of a variety of samples, spanning from polymer films and multilayers, minerals and other geological materials, biological and biomedical samples, to archaeology.
An ensemble of experimental cells are provided and adapted to accommodate various needs allowing experiments at various temperature and pressure conditions, under mechanical stress, etc. Besides working with commercially available equipment adapted to the synchrotron source, the SMIS beamline is a world leading facility in custom built IR instrumentation.
Main technical features
- Infrared and Raman spectromicroscopy with raster mapping and imaging. Near-field IR spectromicroscopy
- High pressure studies
- Low and high temperature measurements
- In situ studies
Sample preparation
For transmission geometry
- Thin sections (microtomed)
- Powders (crushed)
- Thin films (spin coating, dropcasting)
For reflection geometry
- All of the above
- Bulk samples
Access conditions
Access to SOLEIL beamlines is open to scientists coming from all over the world. SOLEIL deals with proposals submitted by scientists from academic institutions as well as researchers and engineers from commercial organisations and private companies. Access may be of two kinds:
- Free of charge for users whose results are open for publication (mandatory) and whose proposal has been evaluated by a Peer Review Committee.
- With charge for admission for users requesting rapid access and/or confidentiality without peer review process and keeping the proprietary of their results.
For more details: Access modes
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